Digital Noise Monitoring of Defect Origin

ISBN
9781441944108
$179.99
Author Aliev, Telman
Format Paperback
Details
  • Active Record
  • Individual Title
  • 1 vol.
  • 2007
  • xii, 224
  • Yes
  • 2
  • TA1-2040
This book explores the initial stage of the origin of the defect taking into account technical, biological, and other features of several technologies. These technologies allow the defect monitoring at the beginning of the defect origin to be performed at the expense of extracting information from the noise. This book appeals to a wide audience focused on solving numerous problems.